KPF DRP Overview
The KPF DRP processes raw KPF spectra and associated data products stored in the Level 0 (L0) files into reduced spectra (L1) and radial velocities and other final data products associated with individual observations (L2). The KPF DRP operates within the WMKO DRP Framework using recipes to specify the algorithms applied and config files to specify parameters associated with the processing. A summary of the main recipe used to process KPF data products is below.
Main Recipe
Level 0 to 2D
Remove the overscan region from each amplifier region
Stitch amplifier regions into a single image (per CCD)
Subtract master bias (per CCD)
Subtract scaled master dark (per CCD)
Apply master flat (per CCD)
Apply bad-pixel mask (per CCD)
2D to Level 1
Spectral Extraction
Map the orderlet locations using a rectified master flat.
Extract each order and orderlet using a weighted sum. The weights are determined from the rectified flat.
Reject outliers by comparing the cross-dispersion profile in each column to that expected in a scaled master flat.
Subtract background by measuring the inter-order light.
Copy wavelength solution from the day’s master ThAr or LFC frames.
Calculate photon-weighted midpoint for each order from the exposure meter spectral timeseries.
Ca H&K Spectrometer Spectra
Subtract master bias
Subtract scaled master dark
Spectral Extraction
Apply default wavelength solution to extracted spectra
Level 1 to Level 2
Compute Cross-correlation functions (CCFs) with binary masks
Compute RVs per order and per orderlet from fitting CCF peaks
Compute reweighted RVs based on information content per order
Compute and correct for the barycentric RV using the photon-weighted midpoints.
Wavelength Solution Recipes
ThAr
Step 1
Step 2
Step 3
…
LFC
Step 1
Step 2
Step 3
…
Etalon
Step 1
Step 2
Step 3
…
Master Construction Recipes
The DRP also creates ‘master’ files that are stacks of particular observations of a particular type (e.g., darks, bias, flats). The DRP also has a set of ‘quick-look’ recipes to produce diagnostic plots and measurements.